Planning of Truncated Sequential Binomial Test via Relative Efficiency
Author:
Affiliation:
1. Technion, Israel Institute of Technology; Faculty of Industrial Engineering and Management; Haifa 32000 Israel
2. RAFAEL, Microelectronics Directorate; Haifa 31021 Israel
Publisher
Wiley
Subject
Management Science and Operations Research,Safety, Risk, Reliability and Quality
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/qre.1387/fullpdf
Reference30 articles.
1. Optimum character of the sequential probability ratio test;Wald;Annals of Mathematical Statistics,1948
2. Approximation to the distribution of sample size for sequential tests: I. Tests of simple hypotheses;Bhate;Biometrika,1959
3. The design of truncated sequential test plans based on attributes data;McWilliams;Communications in Statistics Part B- Simulation and Computation,2004
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Planning of sequential binomial tests for various risk ratios;Quality and Reliability Engineering International;2017-11-24
2. Ignatova, I., Deutsch, R. C., and Edwards, D. (2012), “Closed Sequential and Multistage Inference on Binary Responses With or Without Replacement,” The American Statistician, 66, 163-172: Comment by Michlin and Shaham and Reply;The American Statistician;2014-04-03
3. Sequential Test for Reliability Under Allowance for Target Uncertainty;IEEE Transactions on Reliability;2012-12
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