Traceable Nanomechanical Metrology of GaN Micropillar Array-Reference-Cited by-同舟云学术

Traceable Nanomechanical Metrology of GaN Micropillar Array

Published:2018-07-23 Issue:10 Volume:20 Page:1800353
ISSN:1438-1656
Container-title:Advanced Engineering Materials
language:en
Short-container-title:Adv. Eng. Mater.

Author:

Fatahilah Muhammad Fahlesa¹²,Puranto Prabowo³⁴,Yu Feng¹²,Langfahl-Klabes Jannick³,Felgner André³,Li Zhi³,Xu Min³,Pohlenz Frank³,Strempel Klaas¹²,Peiner Erwin¹²,Brand Uwe³,Waag Andreas¹²,Wasisto Hutomo Suryo¹²^ORCID

Affiliation:

1. Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig; Hans-Sommer-Straße 66, D-38106 Braunschweig Germany

2. Laboratory for Emerging Nanometrology (LENA); Technische Universität Braunschweig; Langer Kamp 6, D-38106 Braunschweig Germany

3. Physikalisch-Technische Bundesanstalt (PTB); Bundesallee 100, D-38116 Braunschweig Germany

4. Research Center for Physics, Indonesian Institute of Sciences (LIPI); Kawasan Puspitek Serpong, 15314 Tangerang Selatan Indonesia

Funder

Lower Saxony Ministry for Science and Culture N-MWK

Ministry of Research, Technology and Higher Education of the Republic of Indonesia (RISTEKDIKTI)

German Research Foundation (DFG)

China Scholarship Council (CSC)

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/adem.201800353/fullpdf

Reference53 articles.

1. Recent Progress on Piezotronic and Piezo-Phototronic Effects in III-Group Nitride Devices and Applications

2. Recent Progress in GaN-Based Light-Emitting Diodes

3. GaN Electronics

4. A Review of Mechanical and Electromechanical Properties of Piezoelectric Nanowires

5. Gallium Nitride Nanowires and Heterostructures: Toward Color-Tunable and White-Light Sources

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