Dense estimation of surface reflectance property by combining multiple illumination conditions
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Published:2006-03
Issue:3
Volume:89
Page:59-69
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ISSN:1042-0967
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Container-title:Electronics and Communications in Japan (Part III: Fundamental Electronic Science)
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language:en
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Short-container-title:Electron. Comm. Jpn. Pt. III
Author:
Machida Takashi,Takemura Haruo,Yokoya Naokazu
Subject
Electrical and Electronic Engineering
Reference18 articles.
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2. . Recovering photometric properties of architectural scenes from photographs. Proc SIGGRAPH'98, p 207-217.