Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces-Reference-Cited by-同舟云学术

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Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces

Published:1992-11-01 Issue:3 Volume:23 Page:230-238
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc. Res. Tech.

Author:

Howe J. M.,Rozeveld S. J.

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Reference22 articles.

1. The calculation and interpretation of high-resolution electron microscope images of lattice defects

2. (1989) Solving the structure of interfaces by high resolution electron microscopy. In: Mater. Res. Soc. Symp. Proc. Volume 138, and eds. Materials Research Society, Pennsylvania, pp. 293-304.

3. Core structure of the Lomer dislocation in germanium and silicon

4. The scattering of electrons by atoms and crystals. I. A new theoretical approach

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