Affiliation:
1. School of Microelectronics Shanghai University Shanghai China
2. Research and Development (R&D) Department Shanghai Industrial μTechnology Research Institute Shanghai China
3. State Key Laboratory of Transducer Technology Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences Shanghai China
4. Shanghai Academy of Experimental Medicine Shanghai China
Abstract
AbstractHigh‐resolution interference pattern images are vital for spatial heterodyne Raman spectroscopy to produce quality Raman spectra with a good signal‐to‐noise ratio. A sought‐after super‐resolution algorithm can enhance Raman interference pattern images, reducing reliance on expensive imaging sensors. This enables miniaturization and portability for point‐of‐care testing. This study proposes a generative adversarial network (GAN)‐based super‐resolution reconstruction algorithm explicitly designed for Raman interference patterns. Employing GAN adversarial training, the algorithm effectively reconstructs interference pattern images at higher resolution, improving Raman spectra signal‐to‐noise ratio. Considering Raman spectra analysis mainly focuses on characteristic peaks, a Raman characteristic peak‐focused network training scheme is used. For instance, acetaminophen is studied with two selected Raman characteristic peaks centered at 388 and 858 cm−1. These peaks are observed in Fourier transformed Raman spectra from corresponding low‐resolution interference pattern images obtained by down‐sampling high‐resolution ones by twofold and fourfold. The proposed GAN‐based algorithm successfully reconstructs low‐resolution interference patterns into high‐resolution ones, achieving high R‐square values (96.05% for twofold and 91.1% for fourfold). This innovation holds potential for point‐of‐care applications, like noninvasive blood glucose concentration measurements, enabling cost‐effective, portable Raman spectrometers with improved capabilities.
Funder
Science and Technology Commission of Shanghai Municipality
National Key Scientific Instrument and Equipment Development Projects of China
Key Technologies Research and Development Program
Subject
Spectroscopy,General Materials Science
Cited by
1 articles.
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1. A Novel Gan-Based Data Augmentation Algorithm for Semiconductor Defect Inspection;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17