Affiliation:
1. Institute of Electromagnetics Southwest Jiaotong University Chengdu China
2. School of Optoelectronics University of Chinese Academy of Sciences Beijing China
Abstract
AbstractA novel diagnosis method for impaired subarrayed antenna arrays is proposed in this letter. The proposed method can be applied to the diagnosis of both impaired subarrays and failed elements by analyzing the impairment circumstances and using the compressing sensing‐based method. The accuracy of the diagnosis results is greatly improved through an iterative reweighted ‐norm method with the matrix techniques, even if there are many failed elements in each impaired subarrays. The analysis of numerical examples, including the diagnoisis of linear arrays and planar arrays, and the comparison with the state‐of‐the‐art diagnosis techniques show the superiority of the proposed method for the application of diagnosis of impaired subarrayed arrays.
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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