Theoretical models for microwave pulse induced thermal failure in CMOS integrated circuits-Reference-Cited by-同舟云学术

Theoretical models for microwave pulse induced thermal failure in CMOS integrated circuits

Published:2014-03-11 Issue:5 Volume:56 Page:1144-1151
ISSN:0895-2477
Container-title:Microwave and Optical Technology Letters
language:en
Short-container-title:Microw. Opt. Technol. Lett.

Author:

Chen Jie¹,Du Zhengwei¹

Affiliation:

1. State Key Laboratory on Microwave and Digital Communications; Tsinghua National Laboratory for Information Science and Technology; Department of Electronic Engineering; Tsinghua University; Beijing 100084 China

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/mop.28273/fullpdf

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