Characterization of Pr2O3 Added Metals/GaAs Schottky Diodes using X-ray Photoelectron Spectroscopy
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference19 articles.
1. Surface States and Rectification at a Metal Semi-Conductor Contact
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1. Analysis of current–voltage–temperature characteristics and T0 anomaly in Cr/n-GaAs Schottky diodes fabricated by magnetron sputtering technique;Materials Science and Engineering: B;2009-02
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