Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?-Reference-Cited by-同舟云学术

Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?

Author:

Zhang Jiandong¹²^ORCID,Zhang Yanyan²^ORCID,Collin Marie³,Gin Stephane³^ORCID,Neeway James J.⁴^ORCID,Wang Tieshan¹,Zhu Zihua²^ORCID

Affiliation:

1. School of Nuclear Science and Technology; Lanzhou University; Lanzhou Gansu 730000 China

2. W. R. Wiley Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory; Richland WA 99354 USA

3. CEA, DEN, DE2D, SEVT; F-30207 Bagnols-sur-Ceze France

4. Energy and Environment Directorate, Pacific Northwest National Laboratory; Richland WA 99354 USA

Funder

National Natural Science Foundation of China

Department of Energy's (DOE) Office of Biological and Environmental Research

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

Reference24 articles.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献