Experimental evaluation of the Rhodes-Hunter model for the particle size effect in X-ray fluorescence analysis of ‘thin’ samples

Author:

Hołyńska Barbara,Markowicz Andrzej

Publisher

Wiley

Subject

Spectroscopy

Reference4 articles.

1. Particle size effects in X-Ray emission analysis: Simplified formulae for certain practical cases

2. Heterogeneity Effects in X-Ray Analysis

3. and Introduction to Statistical Analysis. McGraw-Hill, New York (1957).

4. and ‘A Method of Correction of Particle-size Effect in XRF Analysis of Thin Samples Having Particle-size Distribution’, accepted for presentation at the 29th Annual Conference on Applications of X-Ray Analysis, Denver (August 1980).

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. X-ray Fluorescence Spectroscopy Features of Micro- and Nanoscale Copper and Nickel Particle Compositions;Nanomaterials;2021-09-14

2. PIXE–PIGE analysis of size-segregated aerosol samples from remote areas;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-01

3. Self-attenuation artifacts and correction factors of light element measurements by X-ray analysis: Implication for mineral dust composition studies;Journal of Geophysical Research;2010-01-15

4. Estimating particle size effects in X-ray fluorescence spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-07

5. PIXE and PIGE techniques for the analysis of Antarctic ice dust and continental sediments;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3