1. Trace element determination with semiconductor detector x-ray spectrometers
2. Trace Element Analysis in Thick Organic Specimens by Photon Excited X-ray Fluorescence
3. AXIL (Analysis of X-Ray Spectra by Iterative Least-Squares fitting) Program, Sensitivity Calibration Program and Quantitative Analysis of Organic Samples Program. International Atomic Energy Agency, Vienna.
4. Calibration of the Radioisotope-Excited X-Ray Spectrometer with Thick Standards
5. Slope and Intercept Program, Physics Department, Universidad Nacional Pedro Henriquez Ureña, Santo Domingo, Dominican Republic.