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Atomic level widths for x-ray spectrometry

Published:1995-11 Issue:6 Volume:24 Page:307-319
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Campbell J. L.,Papp T.

Publisher

Wiley

Subject

Spectroscopy

Reference79 articles.

1. X-ray spectrometers for PIXE

2. Natural line-width effects in gamma- and X-ray emission rate measurements with semiconductor detectors

3. Energy-dispersive measurement ofKαx-ray linewidths and relative intensities

4. Lorentzian contributions to x-ray lineshapes in Si(Li) spectroscopy

5. An algorithm for fitting Lorentzian-broadened, K-series X-ray peaks of the heavy elements

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3. Experimental validation of theoretically predicted cut-off of L1–L3M4,5 transitions at Z = 50 through measurements of fluorescence and Coster–Kronig yields for Sn and Sb;Metrologia;2021-04-01

4. Experimental evidence for onset of L1–L3M5 transition at Z = 75 through measurements of fluorescence and Coster–Kronig yields for W and Re;Journal of Analytical Atomic Spectrometry;2021

5. Enhanced polarization transfer to the characteristic Lα x-ray lines near the nonlinear Cooper minimum of two-photon ionization;Physical Review A;2020-10-09

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