The calculation of background in wavelength-dispersive electron microprobe analysis
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference10 articles.
1. in Proceedings of the 9th Annual Conference of the Microbeam Analysis Society, Ottawa, pp. 21A-21C (1974).
2. Background corrections for quantitative electron microprobe analysis using a lithium drifted silicon X-ray detector
3. XCIII. On the theory of X-ray absorption and of the continuous X-ray spectrum
4. and in Practical Scanning Electron Microscopy, Electron and lon Microprobe Analysis, edited by and pp. 263-297. Plenum, New York (1975).
5. Prediction of continuum intensity in energy-dispersive x-ray microanalysis
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