1. Analytical transmission electron microscopy of thin films
2. and in (Ed.), Energy Dispersion X-Ray Analysis, ASTM STP 485, American Society for Testing and Materials, Philadelphia, Pennsylvania 1971, p. 232.
3. Quantitative electron microprobe analysis using a lithium drifted silicon detector
4. Thin Section Microanalysis, EDAX Labs, Raleigh North Carolina 1972, p. 115.
5. Ninth Annual Conference of the Microbeam Analysis Society, MAS, Ottawa, Canada 1974, p. 24.