Quantitative elemental analysis of thick samples by XRF and PIXE
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference13 articles.
1. X-ray analysis: Elemental trace analysis at the 10−12 g level
2. Analytical application of particle induced X-ray emission
3. Comparison between PIXE and XRF for applications in art and archaeology
4. ELEMENTAL ANALYSIS OF GOLD COINS BY PARTICLE INDUCED X-RAY EMISSION (PIXE)
5. and Tables and Graphs of Photon interaction Cross-Sections from 1.0 keV to 100 MeV Divided from the LLL Evaluated Data Library, UCRL-50400, Volume 6, revision 1. University of California Livermore (1975).
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