The atomic number and absorption corrections in electron microprobe analysis at low electron energies
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference14 articles.
1. Electron Probe Microanalysis
2. Sur les bases physiques de l'analyse ponctuelle par spectrographie X
3. and Proc. 4th Int. Conf. On X-ray Optics and Microanalysis, Hermann, Paris, 1966, p. 120.
4. Distribution in depth of the primary X-ray emission in anticathodes of titanium and lead
5. Ph. D. Thesis, Univ. of Maryland, 1966.
Cited by 54 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Effects of the introduction of the discrete energy loss process into Monte Carlo simulation of electron scattering;Scanning;2006-12-07
2. Discontinuous Functions in Correction Procedure for X-Ray Microanalysis of Light Elements in Inorganic Materials;Microchimica Acta;2002-11-01
3. Application of auxiliary signals in x-ray fluorescence and electron microprobe analysis for density evaluation;X-Ray Spectrometry;1999-07
4. Comparison of the probability density functions for the ranges of electrons, positrons and protons;Journal of Analytical Atomic Spectrometry;1999
5. X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samples;Modern Developments and Applications in Microbeam Analysis;1998
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3