Author:
Armstrong John T.,Buseck Peter R.
Reference25 articles.
1. A characteristic fluorescence correction for electron-probe microanalysis of thin coatings
2. and Procedings of VIII International Conference on X-Ray Optics and X-Ray Microanalysis, 1977, p. 42A-F, San Francisco Press, San Francisco (1977).
3. Thesis, University of Paris (1951).
4. Thesis, California Institute of Technology, Pasadena, CA (1957).
5. Characteristic fluorescence corrections in electron-probe microanalysis
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