A novel method to ascertain sample mass thickness and matrix effects for X-ray fluorescence element determinations-Reference-Cited by-同舟云学术

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A novel method to ascertain sample mass thickness and matrix effects for X-ray fluorescence element determinations

Published:1994-07 Issue:4 Volume:23 Page:160-168
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Giauque Robert D.

Publisher

Wiley

Subject

Spectroscopy

Reference14 articles.

1. Scattered X-Rays as Internal Standards in X-Ray Emission Spectroscopy

2. A simple method for background and matrix correction of spectral peaks in trace element determination by X-ray fluorescence spectrometry

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1. Thickness measurement of low-Z films fabricated on thick substrate using EDXRF technique;Vacuum;2021-01

2. Effect of carbon on major element analysis of carbonaceous silicate rocks by WD-XRF: An evaluation of error and its correction;Geochemistry: Exploration, Environment, Analysis;2018-07-30

3. Energy-Dispersive, X-Ray Fluorescence Analysis;Encyclopedia of Analytical Chemistry;2018-03-13

4. Sample thickness and quantitative concentration measurements in BrK-edge XANES spectroscopy of organic materials;Journal of Synchrotron Radiation;2014-03-12

5. Quantitative measurement of PM<sub>10</sub> by means of X-ray fluorescence spectra;2013-05-14

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