Repeated intensity measurements for X-ray fluorescence analysis of thin samples and evaluation of a scattered line as an internal standard-Reference-Cited by-同舟云学术

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Repeated intensity measurements for X-ray fluorescence analysis of thin samples and evaluation of a scattered line as an internal standard

Published:1989-02 Issue:1 Volume:18 Page:35-38
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Iwatsuki Masaaki,Ito Makoto,Shimizu Hisae,Endo Masashi,Fukasawa Tsutomu

Publisher

Wiley

Subject

Spectroscopy

Reference4 articles.

1. Statistical factors in X-ray intensity measurements

2. Instrumental Factors and Figure of Merit in the Detection of Low Concentrations by X-Ray Spectrochemical Analysis

3. and Principles of Quantitative X-Ray Fluorescence Analysis, pp. 334-355. Heyden, London (1982).

4. Scattered X-Rays as Internal Standards in X-Ray Emission Spectroscopy

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Studies of uranium—cerium admixture solutions by EDXRF spectroscopy;X-Ray Spectrometry;1995-11

2. Compton peak shift in XRF study of graphite;X-Ray Spectrometry;1992-05

3. Estimation of titanium and iron in uranium by EDXRF using microdroplets on filter paper;Journal of Radioanalytical and Nuclear Chemistry Articles;1991-11

4. Dynamic electrochemistry: methodology and application;Analytical Chemistry;1990-06-15

5. Atomic Spectrometry Update—References;J. Anal. At. Spectrom.;1990

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