1. referenced in Electron Beam X-Ray Microanalysis., Van Nostrand Reinhold, New York (1981).
2. A Further Improvement in the Gaussian ϕ(ϱ) Approach for Matrix Correction in Quantitative Electron Probe Microanalysis
3. and in 11th International Congress on X-Ray Optics and Microanalysis, London (Canada), 1986, p. 249.
4. Errata: 1st European Workshop on Modern Developments and Applications in Microbeam Analysis, Antwerp, 1989, p. 146.
5. and in Electron Probe Quantitation, edited by and and, p. 191. Plenum Press, New York (1991).