X-ray spectrometric determination of major elements in silicate rock samples, using a thin film technique based on ion exchange dissolution-Reference-Cited by-同舟云学术

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X-ray spectrometric determination of major elements in silicate rock samples, using a thin film technique based on ion exchange dissolution

Published:1973-04 Issue:2 Volume:2 Page:57-62
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Govindaraju K.

Publisher

Wiley

Subject

Spectroscopy

Reference31 articles.

1. Analyse des Roches par une Méthode de Fluorescence X comportant une Correction Précise pour l′Effect interélément

2. Ion exchange dissolution method for silicate analysis

3. Colloque du Centre National de la Recherche Scientifique, No. 923, 133 (1970).

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray fluorescence analysis for the determination of potassium in small quantities of silicate minerals for K–Ar dating;Analytica Chimica Acta;2001-08

2. Energy-dispersive x-ray fluorescence analysis of geological materials in borax beads using Tertian's binary coefficient approach combined with internal standard addition;X-Ray Spectrometry;1991-08

3. Routine performance of a matrix-correction free X-ray fluorescence spectrometric method for rock analysis;X-Ray Spectrometry;1978-07

4. Precision and Accuracy of an X-ray Fluorescence Determination of Minor and Trace Elements in Silicate Rocks;Applied Spectroscopy;1975-09

5. Use of X-ray fluorescence for chemical analysis;Journal of Physics E: Scientific Instruments;1974-08

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