Application of synchrotron radiation XRF analysis in high-temperature superconducting thin-film technology-Reference-Cited by-同舟云学术

Application of synchrotron radiation XRF analysis in high-temperature superconducting thin-film technology

Author:

Trounova V. A.,Danilovich V. S.,Zolotarev K. V.,Predtechensii M. R.,Bobrinok O. F.

Publisher

Wiley

Subject

Spectroscopy

Reference7 articles.

1. and in Abstracts of the 1st National Meeting on HTSC Materials Diagnostics, Chernogolovka, 1989, p. 93.

2. and in Abstracts of the 1st National Meeting on HTSC Materials Diagnostics, Chernogolovka, 1989, p. 90.

3. in Abstracts of the 1st National Meeting on HTSC Materials Diagnostics, Chernogolovka, 1989, p. 97.

4. and in Abstracts of the 1st National Meeting on HTSC Materials Diagnostics, Chernogolovka, 1989, p. 107.

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Applications of X-ray Spectrometry;Applied Spectroscopy Reviews;2004-05-24

3. Microelement content of the Novosibirsk reservoir bottom sediments as the reflection of its ecological state;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2000-06

4. Analytical possibilities of SRXRF station at VEPP-3 SR source;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1998-03

5. X-ray Spectrometry;Analytical Chemistry;1996-01-01