Compact multilayer wideband symmetric five-port reflectometer-Reference-Cited by-同舟云学术

Compact multilayer wideband symmetric five-port reflectometer

Published:2017-02-26 Issue:4 Volume:59 Page:802-805
ISSN:0895-2477
Container-title:Microwave and Optical Technology Letters
language:en
Short-container-title:Microw. Opt. Technol. Lett.

Author:

Al-Bawri Samir Salem¹²,Jamlos Mohd Faizal¹³,Ibrahim Siti Zuraidah¹,Aljunid Syed Alwee¹

Affiliation:

1. Advanced Communication Engineering Centre (ACE), School of Computer and Communication Engineering; Universiti Malaysia Perlis (UniMAP), Kampus Pauh Putra; Arau Perlis 02600 Malaysia

2. Faculty of Engineering; Hadhramout University; Hadhramout Yemen

3. Faculty of Mechanical Engineering; Universiti Malaysia Pahang (UMP); Pekan 26300 Malaysia

Funder

Advanced Communication Engineering Centre (ACE), Universiti Malaysia Perlis (UniMAP) for suitable environment and MOHE-PRGS

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

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2. The six-port reflectometer: An alternative network analyzer;Engen;IEEE Trans Microwave Theory Tech,1977

3. A (historical) review of the six-port measurement technique;Engen;IEEE Trans Microwave Theory Tech,1997

4. First-order theory of the five-port symmetrical star junction;Belfort;Electron Lett,1982

5. Performance comparison between Six-Port and five-port Reflectometer;Chahine;Proceedings of the Twentieth National Conference in Radio Science, NRSC 2003,2003

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