Yield estimation for efficient design centring assuming arbitrary statistical distributions-Reference-Cited by-同舟云学术

Yield estimation for efficient design centring assuming arbitrary statistical distributions

Published:1978-07 Issue:3 Volume:6 Page:289-303
ISSN:0098-9886
Container-title:International Journal of Circuit Theory and Applications
language:en
Short-container-title:Int. J. Circ. Theor. Appl.

Author:

Abdel-Malek H. L.,Bandler J. W.

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. ‘New statistical methods for assigning device tolerances’, Proc. 1975 IEEE Symp. on Circuits and Systems, 329–332 (1975).

2. and , ‘The simplicial approximation approach to design centering and tolerance assignment’, Proc. 1976 IEEE Symp. on Circuits and Systems, 706–709 (1976).

3. Regular Polytopes (2nd Ed.), Chap. 7, Macmillan, New York, 1963.

4. Regionalization: A method for generating joint density estimates

5. Idealized statistical models for low-cost linear circuit yield analysis

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