A reliability analysis for electronic devices under an extension of exponentiated perks distribution-Reference-Cited by-同舟云学术

A reliability analysis for electronic devices under an extension of exponentiated perks distribution

Published:2022-12-29 Issue:3 Volume:39 Page:776-795
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Quality & Reliability Eng

Author:

Méndez‐González Luis Carlos¹^ORCID,Rodríguez‐Picón Luis Alberto¹^ORCID,Pérez‐Olguin Ivan Juan Carlos¹^ORCID,Garcia Vicente²^ORCID,Quezada‐Carreón Abel Eduardo²^ORCID

Affiliation:

1. Department of Industrial Engineering and Manufacturing Institute of Engineering and Technology Universidad Autónoma de Ciudad Juárez Ciudad Juárez Chihuahua México

2. Department of Electrical and Computer Engineering Institute of Engineering and Technology Universidad Autónoma de Ciudad Juárez Ciudad Juárez Chihuahua México

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/qre.3255

Reference45 articles.

1. How to Identify a Bathtub Hazard Rate

2. Modeling and detecting approach for the change point of electronic product infant failure rate

3. Modeling the bathtub shape hazard rate function in terms of reliability

4. A Reliability Distribution with Increasing, Decreasing, Constant and Bathtub-Shaped Failure Rates

5. A new bathtub shaped failure rate model: properties, and applications to engineering sector;Arshad MZ;Pakistan J Statistics,2021

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