Scanning Nanowire Probe Interferometer for Scalable Humidity Mapping-Reference-Cited by-同舟云学术

Scanning Nanowire Probe Interferometer for Scalable Humidity Mapping

Published:2020-02-24 Issue:4 Volume:5 Page:1900937
ISSN:2365-709X
Container-title:Advanced Materials Technologies
language:en
Short-container-title:Adv. Mater. Technol.

Author:

Kim Namho¹,Lee Junho¹,Yong Moon‐Jung¹,Yang Un¹,Kim Ji Tae²^ORCID,Kim Jonghwan³⁴,Weon Byung Mook⁵,Kim Chong Cook¹,Je Jung Ho¹^ORCID

Affiliation:

1. X‐ray Imaging Center Department of Materials Science and Engineering Pohang University of Science and Technology 77 Cheongam‐Ro, Nam‐Gu Pohang 37673 Republic of Korea

2. Department of Mechanical Engineering The University of Hong Kong Pokfulam Road Hong Kong China

3. Department of Materials Science and Engineering Pohang University of Science and Technology 77 Cheongam‐Ro, Nam‐Gu Pohang 37673 Republic of Korea

4. Department of Physics Pohang University of Science and Technology 77 Cheongam‐Ro, Nam‐Gu Pohang 37673 Republic of Korea

5. Soft Matter Physics Laboratory School of Advanced Materials Science and Engineering SKKU Advanced Institute of Nanotechnology (SAINT) Sungkyunkwan University Suwon 16419 Republic of Korea

Funder

National Research Foundation of Korea

Publisher

Wiley

Subject

Industrial and Manufacturing Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/admt.201900937

Reference34 articles.

1. Absolute humidity modulates influenza survival, transmission, and seasonality

2. An Assessment of Climate Feedbacks in Coupled Ocean–Atmosphere Models

3. Humidity Sensors

4. Toward ultracompact pseudospark switches

5. Humidity Sensors: A Review of Materials and Mechanisms

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