Charge Contrast Imaging of Nonconductive Samples in the High-Vacuum Field Emission Scanning Electron Microscope-Reference-Cited by-同舟云学术

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Charge Contrast Imaging of Nonconductive Samples in the High-Vacuum Field Emission Scanning Electron Microscope

Published:2007 Issue:5 Volume:29 Page:230-237
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Ji Yuan,Wang Li,Quan Xueling,Fu Jingyong,Zhang Yinqi,Xu Xuedong,Zhong Taoxing,Wei Bin,Liu Cuixiu

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference15 articles.

1. : Ph. D. thesis, University of Western Australia, 2002.

2. Some considerations on the electric field induced in insulators by electron bombardment

3. A gaseous detector device for an environmental SEM

4. , , , , et al.: Scanning Electron Microscopy and X-Ray Microanalysis 3rd ed., Plenum Press 227, New York, 647–656 2003.

5. Charging phenomena on insulating materials: Mechanisms and applications

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research on Electron Emission from Dielectric Materials by a Monte Carlo Method;Moscow University Physics Bulletin;2017-11

2. Monte Carlo Study on Electron Emission from Dielectric Materials;Journal of Computational and Theoretical Transport;2017-07-29

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