Data analytics and stochastic modeling in a semiconductor fab-Reference-Cited by-同舟云学术

Data analytics and stochastic modeling in a semiconductor fab

Published:2010-01 Issue:1 Volume:26 Page:1-27
ISSN:1524-1904
Container-title:Applied Stochastic Models in Business and Industry
language:en
Short-container-title:Appl. Stochastic Models Bus. Ind.

Author:

Bagchi Sugato,Baseman Robert J.,Davenport Andrew,Natarajan Ramesh,Slonim Noam,Weiss Sholom

Publisher

Wiley

Subject

Management Science and Operations Research,General Business, Management and Accounting,Modelling and Simulation

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/asmb.828/fullpdf

Reference22 articles.

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5. Apte C, Weiss S, Grout G. Predicting defects in disk drive manufacturing: a case study in high-dimensional classification. Proceedings of the IEEE Conference on Artificial Intelligence for Applications (93), Orlando, Florida, 1993; 212-218.

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