Author:
Médard N.,Poleunis C.,Eynde X. Vanden,Bertrand P.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference8 articles.
1. Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces
2. Kersting R Pijpers AP Hagenhoff B Verlaek R Stapel D Benninghoven A Schwede BC Proc. 12th International Conference on Secondary Ion Mass Spectrometry Benninghoven A Bertrand P Migeon HN Werner HW 1999 825
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