Quantitative analysis on the microstructure of molten binary KF‐AlF 3 system by in situ Raman spectroscopy assisted with first principles method-Reference-Cited by-同舟云学术

Quantitative analysis on the microstructure of molten binary KF‐AlF 3 system by in situ Raman spectroscopy assisted with first principles method

Published:2019-11-07 Issue:1 Volume:51 Page:187-192
ISSN:0377-0486
Container-title:Journal of Raman Spectroscopy
language:en
Short-container-title:J Raman Spectrosc

Author:

Ma Nan¹²^ORCID,You Jinglin¹,Lu Liming³,Xie Yingfang¹,Wan Songming⁴

Affiliation:

1. State Key Laboratory of Advanced Special Steel, Shanghai Key Laboratory of Advanced Ferrometallurgy, School of Materials Science and EngineeringShanghai University Shanghai 200072 China

2. Hunan Key Laboratory of Applied Environmental PhotocatalysisChangsha University Changsha 410022 China

3. CSIRO Mineral Resources, Technology Court Pullenvale, QLD 4069 Australia

4. Anhui Key Laboratory for Photonic Devices and Materials, Anhui Institute of Optics and Fine MechanicsChinese Academy of Sciences Hefei 230031 China

Funder

Higher Education Discipline Innovation Project

National Natural Science Foundation of China

Publisher

Wiley

Subject

Spectroscopy,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jrs.5751

Reference28 articles.

1. Electrolysis expansion performance of semigraphitic cathode in [K3AlF6/Na3AlF6]-AlF3-Al2O3 bath system

2. Reinvestigation of Molten Fluoroaluminate Raman Spectra: The Question of the Existence of AlF52− Ions