Observation of ground surface roughness values obtained by stylus profilometer and white light interferometer for common metal materials-Reference-Cited by-同舟云学术

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Observation of ground surface roughness values obtained by stylus profilometer and white light interferometer for common metal materials

Published:2022-01-18 Issue:6 Volume:54 Page:587-599
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surface & Interface Analysis

Author:

Lu Enhui¹²³^ORCID,Zhang Ruting²³,Liu Jian²,Yin Shaohui²,Ohmori Hitoshi²³

Affiliation:

1. School of Mechanical Engineering Yangzhou University Yangzhou China

2. State Key Laboratory of Advanced Design and Manufacture for Vehicle Body Hunan University Changsha China

3. Materials Fabrication Laboratory RIKEN (The Institute of Physical and Chemical Research) Saitama Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.7068

Reference28 articles.

1. Introduction to Surface Topography

2. Roughness and function

3. Recent trends in surface metrology

4. Optical Measurement of Surface Topography

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