Affiliation:
1. CAS Key Laboratory of Inorganic Functional Materials and Devices Shanghai Institute of Ceramics, Chinese Academy of Sciences Shanghai 201899 China
2. Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences Beijing 100049 China
Abstract
Scanning thermal microscopy is used to perform direct imaging local conductive path and dynamic behaviors in the degraded multilayer ceramic capacitors (MLCCs) due to the thermal conductivity difference between the dielectric layers and the conductive regions. For local conductive path, its electrical tree dynamic growth behaviors under the dc bias on and off state are clearly obtained in the thermal image. Such phenomena reveal that space–charge‐limited current mechanism dominates in local conductive path region of MLCCs. The results give a strong demonstration of scanning thermal microscopy as a powerful tool for imaging local conductive behavior in MLCCs, which provides us a direct, unique view to clarify local breakdown mechanism and enriches our insights in the insulation resistance degradation and the reliability of MLCCs.
Funder
Institute of Chinese Materia Medica, China Academy of Chinese Medical Sciences and Peking Union Medical College
Subject
Condensed Matter Physics,General Materials Science
Cited by
1 articles.
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