Author:
Olbrycht Robert,Więcek Bogusław,Gralewicz Grzegorz,Świątczak Tomasz,Owczarek Grzegorz
Subject
Electrical and Electronic Engineering,Instrumentation
Reference7 articles.
1. Dillenz, A., Wu, D., Breitrück, K. and Busse, G. 2000. Lock-in thermography for depth resolved defect characterization. 15th World Conference on Nondestructive Testing. October15-212000, Rome, Italy.
2. Gralewicz, G., Owczarek, G. Świątczak, T. and Więcek, B. Thermal model of multilayer structure for NDT thermal parameters evaluation. Proceedings of the 8th Conference on Quantitative Infrared Thermography (QIRT 2006). June27-302006, Padova, Italy. QIRT Open Archives, Paper QIRT 2006-076http:// qirt.gel.ulaval.ca
3. Galmiche, F. and Maldague, X. Depth defect retrieval using the wavelet pulse phase thermography. Proceedings of the 5th Conference on Quantitative Infrared Thermography (QIRT 2000). July18-212000, Reims, France. QIRT Open Archives, Paper QIRT 2000-036http:// qirt.gel.ulaval.ca
Cited by
13 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献