Defect detection by pulse compression in frequency modulated thermal wave imaging
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://www.tandfonline.com/doi/pdf/10.3166/qirt.2.41-54
Reference8 articles.
1. Localization of weak heat sources in electronic devices using highly sensitive lock-in thermography
2. Short-time Fourier and wavelet transforms for fault detection in power transformers during impulse tests
3. Tuli, S. and Mulaveesala. Frequency-Modulated wave Thermography for Non-Destructive Testing. Proceedings, QIRT-2004. pp.H.6.1–H.6.6.
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