Characterization of metallic oxide thin-layer materials by Auger Electron Spectroscopy (AES) combined with Ar+ ion etching
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Published:2007-08-23
Issue:4
Volume:32
Page:383-394
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ISSN:0151-9107
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Container-title:Annales de chimie Science des Matériaux
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language:
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Short-container-title:Ann. Chim. Sci. Mat.
Publisher
International Information and Engineering Technology Association
Subject
Materials Chemistry