Author:
Fan Liming,Wang Kunsheng,Fan Dongming
Abstract
The accurate and effective reliability prediction of light emitting diode (LED) drivers has
emerged as a key issue in LED applications. However, previous studies have mainly focused on the reliability of electrolytic capacitors or other single components while ignoring circuit topology. In this study, universal generating function (UGF) and physics of failure (PoF) are integrated to predict the reliability of LED drivers. Utilizing PoF, lifetime data for each component are obtained. A system reliability model with multi-phase is established, and system reliability can be predicted using UGF. Illustrated by a two-channel LED driver, the beneficial effects of capacitors and MOSFETs for the reliability of LED drivers is verified. This study (i) provides a universal numerical approach to predict the lifetime of LED drivers considering circuit topology, (ii) enhances the modelling and reliability evaluation of circuits, and (iii) bridges the gap between component and circuit system levels.
Publisher
Polskie Naukowo-Techniczne Towarzystwo Eksploatacyjne
Subject
Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality
Cited by
2 articles.
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