Inheritance; Low Correlations of Leaf, Pod, and Seed Reactions to Common Blight Disease in Common Beans; and Implications for Selection

Author:

Arnaud-Santana Eladio,Coyne D.P.,Eskridge K.M.,Vidaver A.K.

Abstract

The heritability of leaf, pod, and seed reactions; stem color and abaxial leaf pubescence; and the association of these traits were studied in advanced dry bean recombinant inbred lines derived from the Phaseolus vulgaris crosses `PC-SO' × XAN-159, `PC-50' × BAC-6, and `Venezuela 44' × BAC-6. The reaction to Xcp was quantitatively inherited in all three plant organs. Qualitative inheritance was found for stem color and leaf pubescence. Low to intermediate heritability values were obtained for the leaf and seed reactions to Xcp. Heritability estimates were consistently low for the pod reaction to Xcp. Low nonsignificant Pearson correlations were detected between leaf and pod reactions, leaf and seed reactions, and pod and seed reactions, except for the latter two correlations, which were low and significant in lines from the cross `PC-50' × XAN-154. Genetic correlations between leaf and pod reactions and leaf and seed reactions were low and significant in lines from all crosses, except for Venezuela 44 × BAC-6 in the latter case. Genetic correlations between pod and seed reactions were low and nonsignificant, except in the cross `PC-50' × XAN-159, for which a low significant correlation was observed. No significant association was found between Xcp leaf reaction and stem color or leaf pubescence. A breeding strategy for improving resistance to Xcp in P. vulgaris is discussed.

Publisher

American Society for Horticultural Science

Subject

Horticulture,Genetics

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3