Research on Image-Based Automatic Wafer Surface Defect Detection Algorithm

Author:

Zhou Yefan,

Publisher

EJournal Publishing

Subject

Microbiology

Cited by 29 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Development and Application of Control Rod Drive Mechanism Latch Assembly Inspection Equipment;2024 IEEE 2nd International Conference on Power Science and Technology (ICPST);2024-05-09

2. Improved YOLOv5s algorithm for aluminum sheet surface defect detection deployed on FPGA;2024 8th International Conference on Intelligent Systems, Metaheuristics & Swarm Intelligence (ISMSI);2024-04-24

3. Research on pavement crack detection algorithm based on adversarial and depth-guided network;Fifteenth International Conference on Graphics and Image Processing (ICGIP 2023);2024-03-25

4. An improved rail crack detection method based on the wavelet subband LMS adaptive filtering and wavelet analysis;Fifteenth International Conference on Graphics and Image Processing (ICGIP 2023);2024-03-25

5. Larger Window Size of Patch-wise Metric Based on Structure Similarity for Tiny Defects Localization on Grid Products;Proceedings of the 2024 7th International Conference on Image and Graphics Processing;2024-01-19

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