Author:
Teo Teow Wee, ,Abdullah Mohd Zaid
Subject
Computer Graphics and Computer-Aided Design,Computer Science Applications,Computer Vision and Pattern Recognition
Cited by
28 articles.
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3. Larger Window Size of Patch-wise Metric Based on Structure Similarity for Tiny Defects Localization on Grid Products;Proceedings of the 2024 7th International Conference on Image and Graphics Processing;2024-01-19
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5. A Power Image Comparison Technology Based on SIFT Algorithm;2023 7th International Conference on Power and Energy Engineering (ICPEE);2023-12-22