A New Variable-Censoring Control Chart Using Lifetime Performance Index under Exponential and Weibull Distributions

Abstract

In reliability theory or life testing, exponential distribution and Weibull distribution are frequently considered to model the lifetime of the components or systems. In this paper, we design a control chart based on the lifetime performance index using Type II censoring for exponential and Weibull distributions. Average run length helps to measure the performance of the proposed control chart. The optimal values of the number of failure items and decision criteria used to decide whether the process is in-control or out-of-control based on the sample results are determined such that the in-control average run length is as close as to the specified average run length values. We simulate the data to illustrate the performance of the proposed control chart.