Fail-Stop Group Signature Scheme

Author:

Chen Jonathan Jen-Rong1,Chiang Yi-Yuan2,Hsu Wang-Hsin3,Lin Wen-Yen3ORCID

Affiliation:

1. Department of Information Management, Vanung University, Taoyuan 302, Taiwan

2. Department of Computer Science and Information Engineering, Vanung University, Taoyuan 302, Taiwan

3. Department of Information Management, National Taichung University of Science and Technology, Taichung 404, Taiwan

Abstract

In this study, a fail-stop group signature scheme (FSGSS) that combines the features of group and fail-stop signatures to enhance the security level of the original group signature is proposed. Assuming that FSGSS encounters an attack by a hacker armed with a supercomputer, this scheme can prove that the digital signature is forged. Based on the aforementioned objectives, this study proposes three lemmas and proves that they are indeed feasible. First, how does a recipient of a digitally signed document verify the authenticity of the signature? Second, when a digitally signed document is under dispute, how can the group’s manager determine the identity of the original group member who signed the document, if necessary, for an investigation? Third, how can one prove that the signature is indeed forged following an external attack from a supercomputer? Following an attack, the signature could be proved to be forged without exposing the key. In addition, the ultimate goal of the group fail-stop signature scheme is to stop using the same key immediately after the discovery of a forgery attack; this would prevent the attack from being repeated.

Funder

Ministry of Education

Publisher

Hindawi Limited

Subject

Computer Networks and Communications,Information Systems

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An Efficient Group Signature Scheme Based on ECDLP;Proceedings of International Conference on Data Science and Applications;2023

2. A New Fail-Stop Group Signature over Elliptic Curves Secure against Computationally Unbounded Adversary;International Journal of Electrical and Electronics Research;2022-06-30

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