New One-Sided EWMA t Charts without and with Variable Sampling Intervals for Monitoring the Process Mean

Author:

Wang Yan1ORCID,Hu Xuelong1ORCID,Zhou Xiaojian1ORCID,Qiao Yulong2ORCID,Wu Shu3ORCID

Affiliation:

1. School of Management, Nanjing University of Posts and Telecommunications, Nanjing 210003, China

2. School of Automation, Nanjing University of Science and Technology, Nanjing 210094, China

3. School of Logistics, Wuhan University of Technology, Wuhan, China

Abstract

In statistical process control (SPC), t charts play a vital role in the monitoring of the process mean, especially when the process variance is unknown. In this paper, two separate upper-sided and lower-sided exponentially weighted moving average (EWMA) t charts are first proposed and the Monte Carlo simulation method is used to obtain their run length (RL) properties. Compared with the traditional one-sided EWMA t charts and several run rules t charts, the proposed charts are proven to have better performance than these competing charts. In addition, by adding the variable sampling interval (VSI) feature to the proposed charts, the new VSI one-sided EWMA t charts are shown to detect different shift sizes in the process more efficient than the chart without VSI feature. Finally, an example of a milk filling process illustrates the use of the charts.

Funder

National Natural Science Foundation of China

Publisher

Hindawi Limited

Subject

General Engineering,General Mathematics

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