Small Angle X-Ray Scattering Technique for the Particle Size Distribution of Nonporous Nanoparticles

Abstract

Nanoparticles are small particles whose sizes are less than 100 nm. They have many industrial applications due to their unique properties. Their properties are often size-dependent; thus the accurate determination of nanoparticle sizes is important for quality assurance of nanoparticle production processes. A small angle X-ray scattering technique is a promising method used for characterizing nanoparticle sizes. It has distinctive advantages over other techniques such as electron microscope techniques. In this paper, we review the state-of-the-art methods for determining the sizes of nanoparticles with small angle X-ray experiments and discuss the advantages and limitations of the state-of-the-art methods.