Strange Temperature Characteristics of RuO2-Based Thick Film Resistors-Reference-Cited by-同舟云学术

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Strange Temperature Characteristics of RuO2-Based Thick Film Resistors

Published:1982 Issue:3 Volume:9 Page:205-207
ISSN:0305-3091
Container-title:ElectroComponent Science and Technology
language:en
Short-container-title:ElectroComponent Science and Technology

Author:

Inokuma Toshio¹,Taketa Yoshiaki²,Haradome Miyoshi²

Affiliation:

1. Shoei Chemical Inc., 2–6–1 Nishi-Shinjuku, Shinjuku-ku, Tokyo, Japan

2. Physical Science Laboratories, Nihon University, 1–2–1 Izumicho, Chiba-ken, Narashino, Japan

Publisher

Hindawi Limited

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://downloads.hindawi.com/journals/apec/1982/206897.pdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fabrication of La₁₋_xSr_xMnO₃ thin films by chemical solution deposition for high-temperature resistive materials;Journal of the Ceramic Society of Japan;2014

2. The effect of various factors on the resistance and TCR of RuO2thick-film resistors-relation between the electrical properties and particle size of constituents, physical properties of glass and firing temperature;Electrical Engineering in Japan;1989-05

3. A review of thick film glaze resistors;Microelectronics Journal;1988-07

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