Analysis of Physical, Ocular, and Aquaphobic Properties of Zirconium Oxide Nanofilms by Varying Sputtering Pressure

Author:

Kumar Sujit1,Dave Vikramaditya2,Krishnan Muthamil Bala3,Amudha V.4,Gomathi S.5,Soni Sanjay6,Jeelani Syed Hamim7,Subbiah Ram8,Negash Kassu9ORCID

Affiliation:

1. Department of Electrical and Electronics Engineering, Jain (Deemed-to-Be University), Bengaluru, Karnataka 560069, India

2. Department of Electrical Engineering, College of Technology and Engineering, Udaipur, Rajasthan 313001, India

3. Research Scholar, Department of Biomedical Engineering, SRM Institute of Science and Technology, Kattankulathur, Tamil Nadu 603203, India

4. Department of Electronics and Communication Engineering, Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences, Chennai, Tamil Nadu 602105, India

5. Department of Electrical and Electronics Engineering, St. Joseph’s Institute of Technology, Chennai, Tamil Nadu 600119, India

6. Department of Industrial and Production Engineering, Jabalpur Engineering College, Jabalpur, Madhya Pradesh 482002, India

7. Department of Civil Engineering, Koneru Lakshmaiah Education Foundation, Deemed to Be University, Andhra Pradesh 522502, India

8. Department of Mechanical Engineering, Gokaraju Rangaraju Institute of Engineering and Technology, Hyderabad, Telangana 500090, India

9. Department of Mechanical Engineering, Faculty of Manufacturing, Institute of Technology, Hawassa University, Hawassa, Ethiopia

Abstract

A thin coating of zirconium oxide (ZrO2) is placed on outdoor high-voltage insulators to minimize air fouling. ZrO2 thin film coatings were deposited on glass substrates using a DC sputtering (reactive magnetron) technique with sputtering pressures ranging from 5 to 25 mTorr. Characterization of the deposited films was carried out utilizing approaches such as XRD, AFM, CAG, and spectrophotometer. Following the XRD peaks, when 15 mTorr is reached, the average crystallite size increases, after which it begins to decline. The wettability of the deposited thin layer is associated with the coarseness calculated by AFM. At 15 mTorr pressure, maximum aquaphobic is achieved (107.45°). At this pressure, the transmittance and bandgap were similarly determined to be 90% and 5.43 eV, respectively.

Publisher

Hindawi Limited

Subject

General Materials Science

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