Affiliation:
1. College of Science, Xi’an University of Science and Technology, Xi’an 710054, China
2. Laboratory of Modern Acoustics, Institute of Acoustics, Nanjing University, Nanjing 210093, China
Abstract
The resonance frequency,fs, and the effective electromechanical coupling factor,keff2, of thin film bulk acoustic resonators (FBARs) are derived by transfer matrix method. The effects of thickness and density of electrode onfsandkeff2with different piezoelectric layers are investigated by numerical calculation method. The results show that thickness and density of electrode affectfsobviously, especially in large thickness and density area. Moreover, the effects of thickness, density, and acoustic velocity of electrode onkeff2of FBAR were also studied. The results show that there is a maximumkeff2corresponding to the composition of thickness and density of electrode which is about 20% over the original electromechanical factor of piezoelectric film.keff2is in the direct proportion to the densityρeandveof electrode, respectively. The electrode thickness affectskeff2small with highve; moreover, whenveis high enough, thenkeff2has almost nothing to do withde.keff2always rises with electrode thickness first and then descends with its rising, and the thickness corresponding to the maximumkeff2is different with different electrode, but it always locates in the special area. All above results indicate that the thickness, density, and acoustic velocity of electrode are so important that these results can be applied to design FBAR.
Funder
National Natural Science Foundation of China
Subject
General Materials Science
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献