Fast Software Implementation of Serial Test and Approximate Entropy Test of Binary Sequence

Author:

Yang Xian-wei1,Zhan Xue-qiu1ORCID,Kang Hong-juan2,Luo Ying3

Affiliation:

1. Wuxi Institute of Technology, Wuxi, China

2. Sichuan Changhong Electric Co., Ltd., Chengdu, China

3. Sichuan Innovation Center of Industrial Cyber Security Co., Ltd., Chengdu, China

Abstract

In many cryptographic applications, random numbers and pseudorandom numbers are required. Many cryptographic protocols require using random or pseudorandom numbers at various points, e.g., for auxiliary data in digital signatures or challenges in authentication protocols. In NIST SP800-22, the focus is on the need for randomness for encryption purposes and describes how to apply a set of statistical randomness tests. These tests can be used to evaluate the data generated by cryptographic algorithms. This paper will study the fast software implementation of the serial test and the approximate entropy test and propose two types of fast implementations of these tests. The first method is to follow the basic steps of these tests and replace bit operations with byte operations. Through this method, compared with the implementation of Fast NIST STS, the efficiency of the serial test and approximate entropy test is increased by 2.164 and 2.100 times, respectively. The second method is based on the first method, combining the statistical characteristics of subsequences of different lengths and further combining the two detections with different detection parameters. In this way, compared to the individual implementation of these tests, the efficiency has been significantly improved. Compared with the implementation of Fast NIST STS, the efficiency of this paper is increased by 4.078 times.

Publisher

Hindawi Limited

Subject

Computer Networks and Communications,Information Systems

Reference23 articles.

1. A statistical test suite for the validation of random number generators and pseudo random number generators for cryptographic applications;A. Rukhin,2010

2. “Book Stack” as a New Statistical Test for Random Numbers

3. Recommendation for random number generation using deterministic random bit generators, [EB/OL]. revision 1, NIST special publication 800-90Ar1;E. Barker,2015

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