Resolution Improvement in Stage-Scanning Electron Holography: Comparison with Conventional Electron Holography-Reference-Cited by-同舟云学术

Resolution Improvement in Stage-Scanning Electron Holography: Comparison with Conventional Electron Holography

Published:2013-07-21 Issue: Volume:2013 Page:1-5
ISSN:2090-6072
Container-title:ISRN Nanotechnology
language:en
Short-container-title:ISRN Nanotechnology

Author:

Lei Dan¹^ORCID,Mitsuishi Kazutaka²^ORCID,Harada Ken³,Shimojo Masayuki⁴^ORCID,Ju Dongying¹,Takeguchi Masaki⁵

Affiliation:

1. Department of Materials Science and Engineering, Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293, Japan

2. Surface Physics and Structure Unit, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0003, Japan

3. Advanced Measurement and Analysis Center, Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-0395, Japan

4. Department of Materials Science and Engineering, Shibaura Institute of Technology, 3-7-5 Toyosu, Koto-ku, Tokyo 135-8548, Japan

5. Transmission Electron Microscopy Station, National Institute for Materials Science, 3-13 Sakura, Tsukuba 305-0003, Japan

Abstract

Electron holography provides information on the phase and amplitude of electron wave passing through a specimen. The recently proposed stage-scanning electron holography technique should improve the spatial resolution of phase and amplitude images compared to the conventional electron holography based on the Fourier transformation method. To demonstrate the resolution improvement, cobalt nanoparticles were observed using the stage-scanning holography and the conventional holography, and significantly sharper images were obtained with the former technique.

Funder

Ministry of Education, Culture, Sports, Science and Technology

Publisher

Hindawi Limited

Subject

Pharmacology (medical),Complementary and alternative medicine,Pharmaceutical Science

Link

http://downloads.hindawi.com/archive/2013/368671.pdf

Reference16 articles.

1. Electron holography—basics and applications

2. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

3. Reconstruction technique for off-axis electron holography using coarse fringes

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