Fault Diagnosis of Capacitance Aging in DC Link Capacitors of Voltage Source Inverters Using Evidence Reasoning Rule

Author:

Liao Linhao1ORCID,Gao Haibo1ORCID,He Yelan2ORCID,Xu Xiaobin3ORCID,Lin Zhiguo1,Chen Yajie4,You Fubing1ORCID

Affiliation:

1. School of Energy and Power Engineering, Wuhan University of Technology, Wuhan, China

2. School of Computer Science and Technology, Wuhan University of Technology, Wuhan, China

3. Institute of System Science and Control Engineering, Hangzhou Dianzi University, Hangzhou, China

4. The 711th Research Institute of China Shipbuilding Industry Corporation, Shanghai, China

Abstract

Capacitance aging of DC link capacitors in voltage source inverters (VSIs) is a common fault which can lead to instability of the DC voltage. In such a failure state, although the VSI can still work, its performance gradually deteriorates, resulting in a shorter service life of the equipment. Here, an online monitoring and fault diagnosis method for capacitance aging based on evidence reasoning (ER) rule is presented. Features from the DC link voltage data with different levels of capacitance aging are extracted, and data features are generated as pieces of diagnostic evidence, which are then combined according to the ER rule. Finally, capacitance aging fault levels were estimated using the combined results. This method has better diagnostic performance compared to a backpropagation (BP) neural network approach and can be used to flexibly define the relative weighting of each evidence parameter depending on the application. This approach can therefore be widely used for fault diagnosis of an array of different devices.

Funder

NSFC-Zhejiang Joint Fund for the Integration of Industrialization and Informatization

Publisher

Hindawi Limited

Subject

General Engineering,General Mathematics

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