Effect of Premelting on Conductivity of DNA-Lipid Films

Author:

Kasumov A. Yu.123,Nakamae S.456,Cazayous M.45,Kawasaki T.7,Okahata Y.7

Affiliation:

1. Laboratoire de Physique des Solides, UMR 8502 CNRS, Bâtiment 510, Université Paris-Sud, 91405 Orsay Cedex, France

2. Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences (RAS), 142432 Chernogolovka, Moscow Region, Russia

3. RIKEN, Hirosawa 2-1, Wakō, Saitama 351-0198, Japan

4. Laboratoire de Physique du Solide, CNRS UPR 5, Ecole Supérieure de Physique et Chimie Industrielles de la Ville de Paris (ESPCI), 75231 Paris Cedex, France

5. Laboratoire de Matériaux et Phénomène Quantiques (UMR 7162), UMR 7162, Université Denis-Diderot-Paris 7, 75251 Paris, France

6. Service de Physique de l'Etat Condensé, Commissariat à l'Énergie Atomique (CEA), Centre d'études de Saclay, 91191 Gif-sur-Yvette, France

7. Department of Biomolecular Engineering, Tokyo Institute of Technology, 4259 Nagatsuda, Midori-ku, Yokohama 226-8501, Japan

Abstract

We have measured temperature-dependent (between 20 and80C) electrical conductivity and molecular structure (Raman spectroscopy) of DNA-lipid cast film. Our findings show that the conductivity is strongly influenced by premelting effects in the molecular structure starting near physiological temperatures (40C), prior to the global DNA denaturation.

Funder

Russian Foundation for Basic Research

Publisher

Hindawi Limited

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